Elsevier Series in Mechanics of Advanced Materials- Characterization Techniques for Polymer Composite Materials

Prijzen vanaf
208,97

Uitgelicht

VERGELIJK ALLE AANBIEDERS (2)

Beschrijving

Bol Characterization Techniques for Advanced Polymer Composite Materials outlines methods for assessing the properties of advanced polymer composite materials, discussing sample preparation, microscopy and scattering techniques, data analysis and interpretation, microstructure identification, constitutive models, and more. It introduces the constituting laws of soft materials and demonstrates how to identify microstructure based on microscopy images. Techniques for measuring the thermal properties, electrical, and thermal characterization of these materials are covered including scanning electron microscopy, transmission electron microscopy, focused ion beam microscopy, as well as scattering techniques such as wide-angle X-ray, small-angle x-ray, and small-angle neutron. Each chapter starts with a brief explanation of the characterization technique followed by practical examples demonstrating methods of interpreting experimental results.

Vergelijk aanbieders (2)

Shop
Prijs
Verzendkosten
Totale prijs
208,97
Gratis
208,97
Naar shop
Gratis Shipping Costs
209,00
Gratis
209,00
Naar shop
Gratis Shipping Costs
Beschrijving (1)

Characterization Techniques for Advanced Polymer Composite Materials outlines methods for assessing the properties of advanced polymer composite materials, discussing sample preparation, microscopy and scattering techniques, data analysis and interpretation, microstructure identification, constitutive models, and more. It introduces the constituting laws of soft materials and demonstrates how to identify microstructure based on microscopy images. Techniques for measuring the thermal properties, electrical, and thermal characterization of these materials are covered including scanning electron microscopy, transmission electron microscopy, focused ion beam microscopy, as well as scattering techniques such as wide-angle X-ray, small-angle x-ray, and small-angle neutron. Each chapter starts with a brief explanation of the characterization technique followed by practical examples demonstrating methods of interpreting experimental results.


Productspecificaties

Merk Elsevier
EAN
  • 9780443403309
Maat


Prijshistorie

* Prijshistorie bevat geen data van Amazon.

Prijzen voor het laatst bijgewerkt op:

Uitgelichte Keuze
208,97
Naar shop